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the recombination characteristics must be carefully controlled to obtain the desired device performance
SEMI M61 — Specification for Silicon Epitaxial Wafers with Buried Layers
本标准包括光伏组件用超薄玻璃的性能要求、测试方法、抽样和判定规则等。
This Standard was technically approved by the Photovoltaic - Materials Global Technical Committee
PV02200 - SEMI PV22 - 太陽光電池用シリコンウェーハの仕様 Revision:SEMI PV22-1011 - Superseded the recombination characteristics must beglobal Photovoltaic Committee2011912global Audits and Reviews Subcommittee201110www. semiviews. org www. semi. org (PV) Referenced SEMI Standards SEMI M35 Guide for Developing Specifications for Silicon Wafer Surface Features Detected by Automated Inspection SEMI M44 Guide to Conversion Factors for Interstitial Oxygen in Silicon SEMI M53 Practice for Calibrating Scanning Surface Inspection Systems Using Depositions of Monodisperse Polystyrene Latex
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