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SEMI E176-1017 (first published)
TTV is also critical in certain bonded wafer manufacturing process steps
超音波発生器
and widely distributed data are fully supported
E18300 - SEMI E183 - Specification for Rich Interactive Test Database (RITdb) Revision:SEMI E183-1121 - Superseded SEMI E176-1017 (first published)This Specification describes a data and event sharing and streaming methodology for semiconductor test and related operations. The scheme fully supports legacy equipment and allows equipment vendors the flexibility to provide additional data items via extensions. Real time, historical, and widely distributed data are fully supported. Provenance of all data is supported via customizable metadata along with cryptographic hashing and signing.
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